Polystone® ECTFE natural
E-CTFE
naturel
plaque
Characteristics
- Chemical resistant
- High purity
- Smooth surface
Industries
Semiconductor factory equipment- Semiconductor Front-End applications
- Semiconductor Front-End Wet Bench
Variants
| SKU | Name | Type | Type | Color | Measurements | Length | Width | Thickness | Height | ||
|---|---|---|---|---|---|---|---|---|---|---|---|
| No stock item (MOQ) | 252060 | Polystone® ECTFE natural pressed | plaque | plaque | naturel | 2.000 x 1.000 x 50 mm | 2 000 mm | 1 000 mm | 50 mm | ||
| No stock item (MOQ) | 291850 | Polystone® ECTFE natural pressed | plaque | plaque | naturel | 2.000 x 1.000 x 15 mm | 2 000 mm | 1 000 mm | 15 mm | ||
| No stock item (MOQ) | 403445 | Polystone® ECTFE natural pressed | plaque | plaque | naturel | 2.000 x 1.000 x 20 (-0/+0,4) mm | 2 000 mm | 1 000 mm | 20 mm |
Technical Specifications Polystone® ECTFE natural
| Test Method | Unit | Guideline Value | |
|---|---|---|---|
| Densité | DIN EN ISO 1183-1 | g / cm3 | >1,65 |
| Test Method | Unit | Guideline Value | |
|---|---|---|---|
| Yield stress | DIN EN ISO 527 | MPa | >30 |
| Elongation at break | DIN EN ISO 527 | % | >50 |
| Tensile modulus of elasticity | DIN EN ISO 527 | MPa | >1600 |
| Test Method | Unit | Guideline Value | |
|---|---|---|---|
| Thermal conductivity | DIN 52612-1 | W / (m * K) | 0,15 (*) |
| Service temperature, long term | Average | °C | -70...150 (*) |
| Service temperature, short term (max.) | Average | °C | -60...180 (*) |
| Test Method | Unit | Guideline Value | |
|---|---|---|---|
| Arc resistance | IEC 60093 | degree | L4 (*) |
